Recognizing black point in wheat kernels and determining its extent using multidimensional feature extraction and a naive Bayes classifier
Chengquan Zhou, Guijun Yang, Dong Liang, Jun Hu, Hao Yang, Jibo Yue, Ruirui Yan, Liang Han, Linsheng Huang, Lijun Xu
Topics & Concepts
Artificial intelligencePattern recognition (psychology)Naive Bayes classifierSegmentationClassifier (UML)Random forestComputer scienceMathematicsComputer visionSupport vector machineSmart Agriculture and AISpectroscopy and Chemometric AnalysesPlant Pathogens and Fungal Diseases