The Degree of Oxidation of Graphene Oxide
Alexandra Carvalho, Mariana C. F. Costa, Valéria S. Marangoni, Pei Rou Ng, Thi Le Hang Nguyen, A. H. Castro Neto
Abstract
We show that the degree of oxidation of graphene oxide (GO) can be obtained by using a combination of state-of-the-art ab initio computational modeling and X-ray photoemission spectroscopy (XPS). We show that the shift of the XPS C1s peak relative to pristine graphene, ΔEC1s, can be described with high accuracy by ΔEC1s=A(cO-cl)2+E0, where c0 is the oxygen concentration, A=52.3 eV, cl=0.122, and E0=1.22 eV. Our results demonstrate a precise determination of the oxygen content of GO samples.
Topics & Concepts
GrapheneX-ray photoelectron spectroscopyOxideOxygenDegree (music)Ab initioMaterials sciencePhotoemission spectroscopyOxidation stateAnalytical Chemistry (journal)NanotechnologyChemical engineeringChemistryPhysicsEnvironmental chemistryMetalOrganic chemistryMetallurgyAcousticsEngineeringGraphene research and applicationsElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devices