A high-efficiency aging test with new data processing method for semiconductor device
Xinhuan Yang, Qianqian Sang, Jianyu Zhang, Chuanzheng Wang, Mingyan Yu, Yuanfu Zhao
Topics & Concepts
Reliability (semiconductor)Test dataReliability engineeringTest methodSemiconductor deviceComputer scienceVoltageDegradation (telecommunications)WeightingElectronic engineeringPoint (geometry)Substrate (aquarium)EngineeringMaterials scienceElectrical engineeringPower (physics)MathematicsNanotechnologyPhysicsOceanographyStatisticsLayer (electronics)GeometryRadiologyMedicineGeologyProgramming languageQuantum mechanicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis