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Nonlocal Time-Resolved Terahertz Spectroscopy in the Near Field

Angela Pizzuto, Enrique Castro-Camus, William L. Wilson, Wonsik Choi, Xiuling Li, Daniel M. Mittleman

2021ACS Photonics32 citationsDOIOpen Access PDF

Abstract

Scattering-type near-field optical microscopy (s-SNOM) has enabled subwavelength spectroscopy measurements on a wide variety of materials and over a large spectral range. These tip-based measurements are of particular interest in the long wavelength regimes, where the study of individual nanoscale samples is very challenging. The combination of s-SNOM techniques with short pulse durations has opened a new realm of possibilities in which nanosystems can be characterized with both high spatial and temporal resolution, for example via optical-pump, terahertz-probe measurements. Here, we demonstrate the first “nonlocal” pump–probe measurement using a scattering-type scanning near-field microscopy technique, in which the pump spot is laterally displaced from the probe location. We observe nonlocal effects corresponding to this pump–probe offset, associated with carrier drift into the s-SNOM near-field probe region.

Topics & Concepts

Near-field scanning optical microscopeOpticsTerahertz radiationSpectroscopyMaterials scienceScatteringNear and far fieldMicroscopyOptical microscopeTerahertz spectroscopy and technologyScanning probe microscopyImage resolutionNear-field opticsPhysicsScanning electron microscopeQuantum mechanicsNear-Field Optical MicroscopyPhotonic and Optical DevicesPlasmonic and Surface Plasmon Research
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