A Terahertz Fast-Sweep Optoelectronic Frequency-Domain Spectrometer: Calibration, Performance Tests, and Comparison with TDS and FDS
Janis Kutz, Lars Liebermeister, Nico Vieweg, Konstantin Wenzel, Robert B. Kohlhaas, Mira Naftaly
Abstract
We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using atmospheric water vapour lines and a silicon wafer etalon; the amplitude linearity is verified using a set of silicon plates. Instrument performance is tested by measuring transmission properties of a variety of representative samples and comparing with a time-domain spectrometer and a frequency-domain spectrometer.
Topics & Concepts
SpectrometerTerahertz radiationCalibrationMaterials scienceFrequency domainOptoelectronicsWaferOpticsFabry–Pérot interferometerTime domainLinearityElectronic engineeringPhysicsComputer scienceEngineeringWavelengthQuantum mechanicsComputer visionTerahertz technology and applicationsSpectroscopy and Laser ApplicationsPhotonic and Optical Devices