Stepwise sulfurization of MoO3 to MoS2 thin films studied by real-time X-ray scattering
Ashin Shaji, Karol Végsö, Michaela Sojková, Martin Hulman, Peter Nádaždy, Yuriy Halahovets, Lenka Príbusová Slušná, Tatiana Vojteková, Jana Hrdá, M. Jergel, E. Majková, Joerg Wiesmann, Peter Šiffalovič
Topics & Concepts
Thin filmScatteringX-rayMaterials scienceOpticsNanotechnologyPhysics2D Materials and ApplicationsMXene and MAX Phase MaterialsChalcogenide Semiconductor Thin Films