Photo-induced force microscopy
Maxim R. Shcherbakov, Eric O. Potma, Yasuhiro Sugawara, Derek Nowak, M. S. Stepanova, Philip R. Davies, Josh Davies-Jones, H. K. Wickramasinghe
Topics & Concepts
MicroscopyMaterials scienceNanotechnologyOpticsPhysicsForce Microscopy Techniques and ApplicationsNear-Field Optical MicroscopyIntegrated Circuits and Semiconductor Failure Analysis