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Maximal length test pattern generation for the cryptography application

Patnala Tulasi Radhika, D. Jayanthi, D. S. Shylu, K. Kavitha, Ch Pratyusha Chowdary

2020Materials Today Proceedings16 citationsDOI

Topics & Concepts

Pseudorandom number generatorCryptographyComputer scienceEncryptionRandom number generationApplication-specific integrated circuitFinancial cryptographyData securityComputer securityEmbedded systemComputer hardwareAlgorithmPublic-key cryptographyPhysical Unclonable Functions (PUFs) and Hardware SecurityCryptographic Implementations and SecurityChaos-based Image/Signal Encryption
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