A Theoretical Performance and Reliability Investigation of a Vertical Hetero Oxide Based JL-TFET under Ideal Conditions
Bandi Venkata Chandan, Dharmender Dharmender, Kaushal Nigam
Topics & Concepts
Materials scienceIdeal (ethics)Reliability (semiconductor)OxideReliability engineeringThermodynamicsMetallurgyPower (physics)EngineeringPhilosophyEpistemologyPhysicsAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis