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Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si

Xuelin Dong, Yuxiang Xiong, Nan Wang, Zhou Song, Jie Yang, Xiumei Qiu, Lihua Zhu

2020Analytica Chimica Acta28 citationsDOI

Topics & Concepts

ChemistryNitric acidInductively coupled plasma atomic emission spectroscopyDissolutionDetection limitMatrix (chemical analysis)DilutionAnalytical Chemistry (journal)QuartzInductively coupled plasmaSample preparationCertified reference materialsSubstrate (aquarium)ChromatographyNuclear chemistryInorganic chemistryMetallurgyOceanographyPlasmaGeologyMaterials scienceThermodynamicsQuantum mechanicsPhysical chemistryPhysicsGeochemistry and Elemental AnalysisAnalytical chemistry methods developmentGeochemistry and Geologic Mapping
Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si | Litcius