SAM-I-Am: Semantic boosting for zero-shot atomic-scale electron micrograph segmentation
Waqwoya Abebe, J. Strube, Luanzheng Guo, Nathan R. Tallent, Oceane Bel, Steven R. Spurgeon, Christina Doty, Ali Jannesari
Topics & Concepts
Electron micrographsMicrographSegmentationElectronAtomic unitsMaterials scienceArtificial intelligenceZero (linguistics)Boosting (machine learning)Electron microscopeComputer sciencePhysicsOpticsScanning electron microscopeQuantum mechanicsComposite materialLinguisticsPhilosophyElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsAdvancements in Photolithography Techniques