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Formation of Dislocations During Phosphorus Doping in the Technology of Silicon p-i-n Photodiodes and their Influence on Dark Currents

Mykola S. Kukurudziak

2022Journal of Nano- and Electronic Physics14 citationsDOIOpen Access PDF

Abstract

Journal of Nano- and Electronic Physics. Scientific journal. ISSN: 2077-6772. Journal abbreviation: J. Nano- Electron. Phys. No page charges. All articles are freely available on-line. Issued 4 times per year. Publisher: Sumy State University. (Sumy, Ukraine)

Topics & Concepts

Dark currentDislocationMaterials scienceIngotDopingImpurityDiffusionSiliconWaferDepletion regionPhosphorusCondensed matter physicsPhotodiodeSemiconductorOptoelectronicsPhotodetectorChemistryComposite materialPhysicsMetallurgyAlloyThermodynamicsOrganic chemistrySemiconductor materials and interfacesSilicon Nanostructures and PhotoluminescenceAdvanced Surface Polishing Techniques
Formation of Dislocations During Phosphorus Doping in the Technology of Silicon p-i-n Photodiodes and their Influence on Dark Currents | Litcius