Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment
Qinyuan Luo, Yuanhong Chang, Jinglong Chen, Hongjie Jing, Haixin Lv, Tongyang Pan
Topics & Concepts
PrognosticsReliability engineeringReliability (semiconductor)EngineeringDegradation (telecommunications)Mode (computer interface)Feature extractionCondition monitoringComputer scienceData miningPattern recognition (psychology)Artificial intelligenceElectronic engineeringPower (physics)Operating systemQuantum mechanicsElectrical engineeringPhysicsMachine Fault Diagnosis TechniquesReliability and Maintenance OptimizationEngineering Diagnostics and Reliability