Litcius/Paper detail

MFMDepth: MetaFormer-based monocular metric depth estimation for distance measurement in ports

Xinqiang Chen, Fei Ma, Yuzheng Wu, Bing Han, Lijuan Luo, Salvatore Antonio Biancardo

2025Computers & Industrial Engineering47 citationsDOI

Topics & Concepts

Metric (unit)MonocularEstimationComputer scienceArtificial intelligenceMathematicsStatisticsComputer visionEngineeringOperations managementSystems engineeringImage Processing Techniques and ApplicationsAdvanced Optical Sensing TechnologiesAdvanced Vision and Imaging