Self-Supervised Plant Phenotyping by Combining Domain Adaptation with 3D Plant Model Simulations: Application to Wheat Leaf Counting at Seedling Stage
Yinglun Li, Xiaohai Zhan, Shouyang Liu, Hao Lü, Ruibo Jiang, Wei Guo, Scott Chapman, Yufeng Ge, Benoît de Solan, Yanfeng Ding, Frédéric Baret
Abstract
= 0.94, root mean square error = 8.7). Complementary studies show that it is essential to simulate images with sufficient realism (background, leaf texture, and lighting conditions) before applying domain adaptation techniques. Furthermore, the spatial resolution should be better than 0.6 mm per pixel to identify leaf tips. The method is claimed to be self-supervised since no manual labeling is required for model training. The self-supervised phenotyping approach developed here offers great potential for addressing a wide range of plant phenotyping problems. The trained networks are available at https://github.com/YinglunLi/Wheat-leaf-tip-detection.