Reliability analysis for systems based on degradation rates and hard failure thresholds changing with degradation levels
Miaoxin Chang, Xianzhen Huang, Frank P. A. Coolen, Tahani Coolen‐Maturi
Topics & Concepts
Degradation (telecommunications)Reliability engineeringReliability (semiconductor)Computer scienceEnvironmental scienceEngineeringThermodynamicsPhysicsTelecommunicationsPower (physics)Reliability and Maintenance OptimizationRisk and Safety AnalysisProbabilistic and Robust Engineering Design