Spatiotemporally Correlated Imaging of Interfacial Defects and Photocurrents in High Efficiency Triple‐Cation Mixed‐Halide Perovskites
Junxi Yu, Boyuan Huang, Xue Zheng, Huan Wang, Fang Chen, Shuhong Xie, Qingyuan Wang, Jiangyu Li
Abstract
Abstract Triple‐cation mixed‐halide perovskites have attracted considerable attention due to their excellent photovoltaic properties and enhanced stability, though the power conversion efficiency (PCE) is still far below the theoretical expectation. In order to understand the microscopic mechanisms responsible for the gap, a Cs 0.05 (FA 0.85 MA 0.15 ) 0.95 Pb(I 0.85 Br 0.15 ) 3 (CsFAMA)‐based solar cell with respectful efficiency over 20% is examined, and distinct high‐ and low‐current regions are observed in photoconductive atomic force microscopy (pc‐AFM) mapping. Simulations attribute the difference in local photocurrents to interfacial donor defect densities at the NiO/CsFAMA interface, which is supported by electrochemical strain microscopy (ESM) mapping, revealing a negative correlation between ionic defects and photocurrents. The interfacial defects can be further manipulated by external bias upon relaxation study, resulting in reduced photocurrents accompanied by topography change when positive ions are driven toward the NiO/CsFAMA interface. It is also observed that both structure variation and photocurrent degradation upon accelerated aging test initiate at grain boundaries, which gradually expand at the expense of grain interior, suggesting that ionic defects are most active at grain boundaries. These findings render a direct correlation between interfacial defects and photocurrents while revealing degradation evolution, and if such interfacial defects heterogeneity can be mitigated, PCE toward the theoretical limit with enhanced stability can be envisioned.