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Thermo-mechanical reliability of glass substrate and Through Glass Vias (TGV): A comprehensive review

Yangyang Lai, Ke Pan, Seungbae Park

2024Microelectronics Reliability49 citationsDOI

Topics & Concepts

Reliability (semiconductor)Materials scienceReliability engineeringSubstrate (aquarium)Composite materialEngineering physicsMechanical engineeringElectronic engineeringEngineeringPhysicsGeologyThermodynamicsPower (physics)Oceanography3D IC and TSV technologiesElectronic Packaging and Soldering TechnologiesAdditive Manufacturing and 3D Printing Technologies
Thermo-mechanical reliability of glass substrate and Through Glass Vias (TGV): A comprehensive review | Litcius