Sequential focused ion beam scanning electron microscopy analyses for monitoring cycled-induced morphological evolution in battery composite electrodes. Silicon-graphite electrode as exemplary case
Victor Vanpeene, Patrick Soucy, Jianhan Xiong, Nicolas Dupré, Bernard Lestriez, Lionel Roué
Topics & Concepts
ElectrodeMaterials scienceScanning electron microscopeFocused ion beamGraphiteParticle (ecology)Composite materialSiliconAnalytical Chemistry (journal)NanotechnologyChemical engineeringOptoelectronicsIonChemistryGeologyChromatographyPhysical chemistryOceanographyOrganic chemistryEngineeringAdvancements in Battery MaterialsAdvanced Battery Technologies ResearchExtraction and Separation Processes