Assimilating leaf area index data into a sugarcane process-based crop model for improving yield estimation
Izael Martins Fattori, Murilo dos Santos Vianna, Fábio Ricardo Marin
Topics & Concepts
DSSATCrop simulation modelLeaf area indexMean squared errorCalibrationMathematicsCropCrop yieldStatisticsGrowing seasonAgricultural engineeringAgronomyEnvironmental scienceBiologyEngineeringLeaf Properties and Growth MeasurementRemote Sensing in AgriculturePlant Water Relations and Carbon Dynamics