Accurate prediction of band gap of materials using stacking machine learning model
Teng Wang, Kefei Zhang, Jesse Van Griensven Thé, Hesheng Yu
Topics & Concepts
StackingBenchmark (surveying)Computer scienceArtificial intelligenceMachine learningBand gapMaterials scienceAlgorithmPhysicsOptoelectronicsGeographyNuclear magnetic resonanceGeodesyMachine Learning in Materials ScienceX-ray Diffraction in CrystallographyGa2O3 and related materials