Litcius/Paper detail

Electron trapping effects in SiC Schottky diodes: Review and comment

Jordan R. Nicholls

2021Microelectronics Reliability19 citationsDOIOpen Access PDF

Topics & Concepts

Schottky diodeOptoelectronicsDiodeMaterials scienceSchottky barrierTrappingSilicon carbideMetal–semiconductor junctionSemiconductorEngineering physicsWide-bandgap semiconductorSemiconductor deviceNanotechnologyEngineeringEcologyBiologyLayer (electronics)MetallurgySilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
Electron trapping effects in SiC Schottky diodes: Review and comment | Litcius