Integrated metrology for advanced manufacturing
Andreas Archenti, Wei Zeng Gao, Alkan Donmez, Enrico Savio, Naruhiro Irino
Abstract
The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends.