Prompt-Based Metric Learning for Few-Shot NER
Yanru Chen, Yanan Zheng, Zhilin Yang
Abstract
Few-shot named entity recognition (NER) targets generalizing to unseen labels and/or domains with few labeled examples. Existing metric learning methods compute token-level similarities between query and support sets, but are not able to fully incorporate label semantics into modeling. To address this issue, we propose a simple method to largely improve metric learning for NER: 1) multiple prompt schemas are designed to enhance label semantics; 2) we propose a novel architecture to effectively combine multiple prompt-based representations.Empirically, our method achieves new state-of-the-art (SOTA) results under 16 of the 18 considered settings, substantially outperforming the previous SOTA by an average of 9.12% and a maximum of 34.51% in relative gains of micro F1.