A universal re-annealing method for enhancing endurance in hafnia ferroelectric memories: Insights from stochastic noise analysis
Ryun‐Han Koo, Wonjun Shin, Jiseong Im, Sangwoo Ryu, Seung Whan Kim, Jangsaeng Kim, Kangwook Choi, Sungho Park, Jonghyun Ko, Jinchen Ji, Mi‐Hwa Oh, Gyuweon Jung, Sung‐Tae Lee, Daewoong Kwon, Jongho Lee
Topics & Concepts
HafniaFerroelectricityAnnealing (glass)Noise (video)Materials scienceComputer scienceMathematicsStatistical physicsPhysicsArtificial intelligenceOptoelectronicsComposite materialDielectricCeramicCubic zirconiaImage (mathematics)Ferroelectric and Negative Capacitance DevicesSemiconductor materials and devicesAdvanced Memory and Neural Computing