Optimization design method for multi-stress accelerated degradation test based on Tweedie exponential dispersion process
Runcao Tian, Fan Zhang, Hongguang Du, Peng Wang
Topics & Concepts
Degradation (telecommunications)Exponential functionDispersion (optics)Process (computing)Stress (linguistics)Computer scienceApplied mathematicsMathematicsMathematical optimizationEngineeringElectronic engineeringMathematical analysisPhysicsOpticsOperating systemPhilosophyLinguisticsReliability and Maintenance OptimizationNon-Destructive Testing TechniquesFatigue and fracture mechanics