28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers
Alessandro Grossi, M. Coppetta, S. Aresu, Andreas Kux, Thomas Kern, R. Strenz
Abstract
We present features adding extra reliability margin for emerging Non-Volatile Memories adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm RRAM Data Memory on high statistics from a microcontroller demonstrator. The results reported show that 28nm embedded RRAM reached an adequate maturity and is ready for replacement of embedded Flash in automotive applications.
Topics & Concepts
Resistive random-access memoryMicrocontrollerAutomotive industryFlash memoryReliability (semiconductor)Embedded systemComputer scienceNon-volatile memoryRandom access memoryComputer hardwareMargin (machine learning)Automotive engineeringEngineeringElectrical engineeringVoltagePower (physics)Aerospace engineeringMachine learningPhysicsQuantum mechanicsAdvanced Memory and Neural ComputingSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices