Litcius/Paper detail

Challenges to overcome breakdown limitations in lateral β-Ga2O3 MOSFET devices

Kornelius Tetzner, Oliver Hilt, Andreas Popp, Saud Bin Anooz, Joachim Würfl

2020Microelectronics Reliability48 citationsDOI

Topics & Concepts

MOSFETBreakdown voltageMaterials scienceOptoelectronicsWaferDopingTransistorSubstrate (aquarium)Field-effect transistorDopantEpitaxyVoltageElectrical engineeringLayer (electronics)NanotechnologyEngineeringOceanographyGeologyGa2O3 and related materialsZnO doping and propertiesElectronic and Structural Properties of Oxides
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