Comparative study of aluminum and nickel contact electrodes for indium–tin–zinc oxide thin film transistors using oxygen vacancy diffusion model
Joong‐Hyun Park, Myunghun Shin, Junsin Yi
Topics & Concepts
Materials scienceThin-film transistorElectrodeAmorphous solidIndiumNickelDiffusionThin filmOptoelectronicsAnalytical Chemistry (journal)MetallurgyNanotechnologyLayer (electronics)CrystallographyPhysical chemistryChromatographyPhysicsChemistryThermodynamicsThin-Film Transistor TechnologiesZnO doping and propertiesTransition Metal Oxide Nanomaterials