Modification of interface properties of Au/n-GaN Schottky junction by rare-earth oxide Nd2O3 as an interlayer and its microstructural characterization
D. Surya Reddy, V. Janardhanam, V. Rajagopal Reddy, Chel‐Jong Choi, Chel‐Jong Choi
Topics & Concepts
Ohmic contactMaterials scienceSchottky barrierSchottky diodeTransmission electron microscopyConductanceDepletion regionOxideOptoelectronicsCapacitanceSemiconductorMetal–semiconductor junctionCondensed matter physicsAnalytical Chemistry (journal)Layer (electronics)NanotechnologyChemistryDiodeElectrodeMetallurgyPhysical chemistryPhysicsChromatographySemiconductor materials and interfacesSemiconductor materials and devicesSilicon Carbide Semiconductor Technologies