Temperature dependence of optical properties of monolayer WS2 by spectroscopic ellipsometry
Hoàng Tùng Nguyễn, Tae Jung Kim, Han Gyeol Park, Van Long Lê, Xuan Au Nguyen, Dohyoung Koo, Chul‐Ho Lee, Do Duc Cuong, Soon Cheol Hong, Young Dong Kim
Topics & Concepts
MonolayerOverlayerExcitonBrillouin zoneEllipsometryTungsten disulfideChemistryAtmospheric temperature rangeDielectricCondensed matter physicsMaterials scienceAnalytical Chemistry (journal)Thin filmPhysical chemistryThermodynamicsNanotechnologyPhysicsMetallurgyOptoelectronicsChromatography2D Materials and ApplicationsPerovskite Materials and ApplicationsChalcogenide Semiconductor Thin Films