Methods for Determination of the Layer Charge of Smectites: A Critical Assessment of Existing Approaches
George E. Christidis, Georgios D. Chryssikos, Arkadiusz Derkowski, Reiner Dohrmann, Dennis D. Eberl, Emmanuel Joussein, Stephan Kaufhold
Abstract
Abstract Layer charge is an important property of 2:1 phyllosilicates originating from isomorphic substitutions in the structure, from vacancies in the octahedral sheet and from unsatisfied bonds at the edges of the crystals. It is of particular interest in the case of smectites because it affects important properties of this mineral. Several methods have been proposed for determining the layer charge of smectites, namely the structural formula method (SFM), the alkylammonium method (AAM), the NH 4 -method, the K-saturation method, and the O-D method. Most of these methods have been used extensively in the past and they all have advantages and shortcomings. The SFM and the AAM are based on different principles and are considered as primary methods. They have been used for a long time but they are time consuming and they provide contrasting layer charge values, with the AAM yielding consistently lower layer charge values than the SFM, especially for low-charge smectites. The remaining methods have been developed more recently and have been calibrated over their primary counterparts. They are applied easily and are capable of producing a large amount of data within a short time. In this sense they can be used both for geological interpretations and for assessment of bentonite deposits at an industrial scale.