Ultra-reliable quantum dot colliding pulse mode-locked laser as multi-wavelength source for integrated optical interconnects
Jiale Qin, Jingzhi Huang, Bo Yang, Zihao Wang, Ting Wang, Jianjun Zhang
Abstract
For optical interconnect applications, multi-wavelength comb sources require uniform comb spacings and high reliability at high operating temperature. Here, the high-temperature reliability measurements of a InAs quantum dot colliding pulse mode-locked (QD-CPML) laser with 100 GHz comb spacing are systematically investigated. Laser lifetime measurements are performed for over 1600 hours at 80 °C under constant stress current of 150 mA. The mean time to failure (MTTF) of the laser is approximately 38 years (336,203 hours), extracted from the threshold currents extrapolation method. The optical spectral revolutions are also monitored during the aging process, while the grids of comb laser are remarkably stable. The outstanding reliability and spectrum stability make this 100 GHz QD-CPML a promising candidate as a multi-wavelength laser source for datacom and optical I/O applications.