The matrix effect in TOF-SIMS analysis of two-element inorganic thin films
Agnieszka Priebe, Tianle Xie, Gerhard Bürki, László Pethő, Johann Michler
Abstract
Investigation of the matrix effect in Zr-based two-element alloys under continuous bombardment of a Ga<sup>+</sup>primary ion beam in a study of ionization probability towards exploring the potential and limitations of gas-assisted TOF-SIMS.
Topics & Concepts
Matrix (chemical analysis)IonizationAnalytical Chemistry (journal)IonMatrix elementIon beamBeam (structure)Thin filmMaterials scienceChemistryAtomic physicsNanotechnologyComposite materialOpticsPhysicsChromatographyOrganic chemistryParticle physicsIon-surface interactions and analysisMicrostructure and mechanical propertiesNuclear Materials and Properties