Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs
Alok Kumar, Tarun Kumar Gupta, Bhavana P. Shrivastava, Abhinav Gupta
Topics & Concepts
Noise (video)MOSFETY-factorMaterials scienceOptoelectronicsElectronic circuitDegradation (telecommunications)Atmospheric temperature rangeFlicker noiseNoise figureScalingElectrical engineeringElectronic engineeringPhysicsCMOSTransistorComputer scienceVoltageEngineeringMathematicsArtificial intelligenceMeteorologyImage (mathematics)AmplifierGeometrySemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies