Litcius/Paper detail

Identifying causes of crop yield variability with interpretive machine learning

Edward J. Jones, Thomas F. A. Bishop, Brendan Malone, Patrick J. Hulme, Brett Whelan, Patrick Filippi

2021Computers and Electronics in Agriculture72 citationsDOI

Topics & Concepts

Spatial variabilityYield (engineering)Precision agricultureCrop yieldSoil mapAgricultural engineeringTerrainMathematicsComputer scienceSoil scienceEnvironmental scienceStatisticsSoil waterAgronomyGeographyEngineeringCartographyAgricultureArchaeologyBiologyMaterials scienceMetallurgySoil Geostatistics and MappingRemote Sensing in AgricultureSmart Agriculture and AI