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Characterization of a hybrid scanning system comprising acousto-optical deflectors and galvanometer scanners

Daniel Franz, Tom Häfner, Tim Kunz, Gian‐Luca Roth, Stefan Rung, Cemal Esen, Ralf Hellmann

2022Applied Physics B21 citationsDOIOpen Access PDF

Abstract

Abstract We report on the characterization of a hybrid laser scanning system using acousto-optical deflectors in combination with galvanometer scanners for ultra-short pulse laser material processing. The hybrid scanning system is characterized by the roundness of static pulsed ablations of metal thin film on a transparent substrate within the acousto-optical scanning field at different galvanometer scanner deflection angles and laser focal positions. An ablation roundness of more than 90% is reached in a defocusing range of 200 $$\upmu \text{m}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>μ</mml:mi> <mml:mtext>m</mml:mtext> </mml:mrow> </mml:math> within a galvanometer scanfield of 900 $$\text{mm}^2$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:msup> <mml:mtext>mm</mml:mtext> <mml:mn>2</mml:mn> </mml:msup> </mml:math> , corresponding to approximately 74% of the usable scan area of the f -theta lens. A high maximum positioning speed of 843 m/s is pointed out within an acousto-optical scanfield of 0.4 $$\text{mm}^{2}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:msup> <mml:mtext>mm</mml:mtext> <mml:mn>2</mml:mn> </mml:msup> </mml:math> by applying positioning frequencies of up to 1 MHz across a distance of 843 $$\upmu \text{m}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>μ</mml:mi> <mml:mtext>m</mml:mtext> </mml:mrow> </mml:math> . Consequently, the hybrid scanning system combines the advantages of optical and mirror-based scanners, enabling a highly dynamic and extremely precise laser beam positioning in a large processing area.

Topics & Concepts

GalvanometerMaterials scienceLaserAlgorithmPhysicsAnalytical Chemistry (journal)OpticsComputer scienceChemistryChromatographyLaser Material Processing TechniquesPhotoacoustic and Ultrasonic ImagingOptical Coherence Tomography Applications
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