LineFlowDP: A Deep Learning-Based Two-Phase Approach for Line-Level Defect Prediction
Fengyu Yang, Fa Zhong, Guangdong Zeng, Peng Xiao, Wei Zheng
Topics & Concepts
Computer scienceLine (geometry)Artificial intelligencePhase (matter)Deep learningPhysicsMathematicsGeometryQuantum mechanicsIntegrated Circuits and Semiconductor Failure AnalysisIndustrial Vision Systems and Defect DetectionVLSI and Analog Circuit Testing