Multi defect detection and analysis of electron microscopy images with deep learning
Mingren Shen, Guanzhao Li, Dongxia Wu, Yuhan Liu, Jacob R.C. Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, J. Muñoz Pérez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres-Velázquez, Wei Li, Kevin G. Field, Dane Morgan
Topics & Concepts
Deep learningComputer scienceScalabilityMicroscopyArtificial intelligenceElectron microscopePattern recognition (psychology)Materials scienceMachine learningOpticsPhysicsDatabaseMachine Learning in Materials ScienceElectron and X-Ray Spectroscopy TechniquesNon-Destructive Testing Techniques