Self-clocking fast and variation tolerant true random number generator based on a stochastic mott memristor
Gwangmin Kim, Jae Hyun In, Young Seok Kim, Hakseung Rhee, Woojoon Park, Hanchan Song, Juseong Park, Kyung Min Kim
Abstract
Abstract The intrinsic stochasticity of the memristor can be used to generate true random numbers, essential for non-decryptable hardware-based security devices. Here, we propose a novel and advanced method to generate true random numbers utilizing the stochastic oscillation behavior of a NbO x mott memristor, exhibiting self-clocking, fast and variation tolerant characteristics. The random number generation rate of the device can be at least 40 kb s −1 , which is the fastest record compared with previous volatile memristor-based TRNG devices. Also, its dimensionless operating principle provides high tolerance against both ambient temperature variation and device-to-device variation, enabling robust security hardware applicable in harsh environments.