Narrow-waveband spectral indices for prediction of yield loss in frost-damaged winter wheat during stem elongation
Yongfeng Wu, Ying Ma, Xin Hu, Juncheng Ma, Haigen Zhao, Dechao Ren
Topics & Concepts
Frost (temperature)CanopyEnvironmental scienceNormalized Difference Vegetation IndexHyperspectral imagingMultispectral imageYield (engineering)ReflectivityAbsorption of waterAgronomyRemote sensingMeteorologyLeaf area indexBotanyBiologyMaterials scienceGeologyGeographyPhysicsOpticsMetallurgyRemote Sensing in AgricultureHorticultural and Viticultural ResearchLeaf Properties and Growth Measurement