Compact snapshot dual-mode interferometric system for on-machine measurement
Daodang Wang, Xiangyu Fu, Ping Xu, Xiaobo Tian, Oliver Spires, Jian Liang, Heng Wu, Rongguang Liang
Topics & Concepts
InterferometryImage stitchingOpticsComputer scienceSnapshot (computer storage)MetrologyPolarizerScannerSurface roughnessAstronomical interferometerSurface finishMaterials sciencePhysicsOperating systemBirefringenceComposite materialOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical Measurements