Minimum thickness of carbon coating for multipacting suppression
M. Angelucci, A. Novelli, L. Spallino, A. Liedl, R. Larciprete, R. Cimino
Abstract
The authors perform a secondary electron yield study on amorphous Carbon deposited on atomically clean Cu and use X-Ray Photoelectron Spectroscopy, to determine the layer thickness. The paper reports on the reduction of secondary electron yield with thin layer of about 10 nm.
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceYield (engineering)Amorphous solidCarbon fibersSecondary electronsLayer (electronics)CoatingSecondary emissionAmorphous carbonElectronAnalytical Chemistry (journal)Composite materialChemical engineeringCrystallographyChemistryPhysicsEngineeringComposite numberQuantum mechanicsChromatographyElectron and X-Ray Spectroscopy TechniquesAdvancements in Photolithography TechniquesIon-surface interactions and analysis