Characterization of just one atom using synchrotron X-rays
Tolulope Michael Ajayi, Nozomi Shirato, Tomás Rojas, Sarah Wieghold, Xinyue Cheng, Kyaw Zin Latt, Daniel J. Trainer, Naveen K. Dandu, Yiming Li, Sineth Premarathna, Sanjoy Sarkar, Daniel Rosenmann, Yuzi Liu, Nathalie Kyritsakas, Shaoze Wang, Eric Masson, Volker Rose, Xiaopeng Li, Anh T. Ngo, Saw‐Wai Hla
Topics & Concepts
TerbiumExcited stateAtom (system on chip)Characterization (materials science)Absorption edgeAbsorption (acoustics)XANESSynchrotronQuantum tunnellingX-ray absorption spectroscopySpectral lineAtomic physicsSynchrotron radiationAbsorption spectroscopyX-rayChemistryMaterials sciencePhysicsNanotechnologyOpticsOptoelectronicsLuminescenceBand gapComputer scienceAstronomyEmbedded systemDiamond and Carbon-based Materials ResearchHigh-pressure geophysics and materialsAtomic and Subatomic Physics Research