A physics-informed CNN-TSE hybrid network for micro-EDM process monitoring and control
Long Ye, Jun Qian, Dominiek Reynaerts
Topics & Concepts
Artificial intelligenceComputer scienceDeep learningProcess (computing)Signal processingStatistical process controlProbabilistic logicConvolutional neural networkElectronic engineeringMachine learningPattern recognition (psychology)EngineeringDigital signal processingOperating systemAdvanced Machining and Optimization TechniquesAdvanced machining processes and optimizationIndustrial Vision Systems and Defect Detection