Litcius/Paper detail

Progress of nanopositioning and nanomeasuring machines for cross-scale measurement with sub-nanometre precision

Eberhard Manske, Thomas Fröhlich, Roland Füßl, Ingo Ortlepp, Rostyslav Mastylo, Ulrike Blumröder, Denis Dontsov, Michael Kühnel, Paul Köchert

2020Measurement Science and Technology47 citationsDOIOpen Access PDF

Abstract

Abstract Nanopositioning and nanomeasuring machines (NPM-machines), developed at Technische Universität Ilmenau, have provided high-precision measurement and positioning of objects across ten decades, from 20 pm resolution up to 200 mm measuring range. They work on the basis of the error-minimal, extended six degrees of freedom Abbe-comparator principle, with high-precision fibre-coupled laser interferometers and optical or atomic force probes. These machines are suitable not only for measuring but also for positioning with an outstanding sub-nanometre performance. Measurements on precision step heights up to 5 mm show a repeatability of 20 pm. Consecutive step positioning of 80 pm can be demonstrated. With the new approach of an atomic clock-stabilized He–Ne-laser via a high-stable-frequency comb, we achieve a frequency stability of less than 300 Hz, respectively 0.6 ċ 10 −12 relative frequency stability within 1 h at an integration time of 1 s. For the first time, we can demonstrate a direct, permanent and unbroken chain of traceability between the laser interferometric measurement within an NPM-machine and a GPS satellite-based atomic clock. This paper presents a closer insight into the scientific and metrological background as well as unrivalled measurement results, and discusses the great possibilities of this new technology.

Topics & Concepts

MetrologyAtomic clockLaserNanometrologyNanometreAstronomical interferometerRepeatabilityInterferometryGlobal Positioning SystemOpticsComputer scienceAccuracy and precisionStability (learning theory)ComparatorPhysicsElectrical engineeringEngineeringMathematicsTelecommunicationsVoltageStatisticsMachine learningQuantum mechanicsAdvanced Measurement and Metrology TechniquesAdvanced Fiber Laser TechnologiesScientific Measurement and Uncertainty Evaluation