Electrochemical Lithiation and Delithiation in Amorphous Si Thin Film Electrodes Studied by <i>Operando</i> X-ray Photoelectron Spectroscopy
Raimu Endo, Tsuyoshi Ohnishi, Kazunori Takada, Takuya Masuda
Abstract
The electrochemical lithiation/delithiation in amorphous Si thin film electrodes deposited on a L6.6La3Zr1.6Ta0.4O12 are dynamically analyzed by operando X-ray photoelectron spectroscopy. In the initial lithiation, the Si 2p peak corresponding to bulk Si0 significantly shifts to a lower binding energy due to the formation of LixSi and then monotonically with increasing capacity, i.e., the Li content x in LixSi. When the lithiation stops at capacity of 2200 mAh g–1 (x = ∼2.3), the peak recovers monotonically to a higher binding energy throughout the successive delithiation. When Li is inserted into LixSi up to 3400 mAh g–1 (x = 3.5), however, the peak drastically shifts in the capacity range of 1520–1920 mAh g–1 (x = 1.6–2.0) in the successive delithiation. This shift is attributed to the phase transition of crystalline Li15Si4 formed in the preceding lithiation to the amorphous phase. The mechanism of initial lithiation/delithiation at each step is summarized on the basis of the state of charge, Li content x in LixSi, and positions of XPS peaks.