Quality safety monitoring of LED chips using deep learning-based vision inspection methods
Yufeng Shu, Bin Li, Hui Lin
Topics & Concepts
Softmax functionArtificial intelligenceComputer scienceConvolutional neural networkFeature (linguistics)Deep learningFeature extractionPyramid (geometry)Pattern recognition (psychology)Artificial neural networkComputer visionLinguisticsOpticsPhilosophyPhysicsIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsAdvanced Measurement and Detection Methods