TEM-based dislocation tomography: Challenges and opportunities
Zongqiang Feng, Rui Fu, Chengwei Lin, Guilin Wu, Tianlin Huang, Ling Zhang, Xiaoxu Huang
Topics & Concepts
DislocationMaterials scienceCharacterization (materials science)Electron tomographyTomographyDislocation creepTransmission electron microscopyCrystallographyTomographic reconstructionOpticsNanotechnologyScanning transmission electron microscopyComposite materialPhysicsChemistryAdvanced Electron Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Materials Characterization Techniques