Litcius/Paper detail

Role of annealing temperature of nickel oxide (NiOx) as hole transport layer in work function alignment with perovskite

Muhammad Imran, Hikmet Coşkun, Nawazish A. Khan, Jianyong Ouyang

2021Applied Physics A43 citationsDOI

Topics & Concepts

Ultraviolet photoelectron spectroscopyWork functionX-ray photoelectron spectroscopyAnnealing (glass)OptoelectronicsMaterials scienceDopingNickel oxideThin filmPerovskite (structure)PhotoluminescenceLayer (electronics)UltravioletNickelAnalytical Chemistry (journal)NanotechnologyChemical engineeringChemistryComposite materialMetallurgyCrystallographyChromatographyEngineeringPerovskite Materials and ApplicationsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And Properties